Cement Compressive Strength Control Using CUSUM and MCUSUM Control Chart
نویسندگان
چکیده
منابع مشابه
A risk adjusted self-starting Bernoulli CUSUM control chart with dynamic probability control limits
Usually, in monitoring schemes the nominal value of the process parameter is assumed known. However, this assumption is violated owing to costly sampling and lack of data particularly in healthcare systems. On the other hand, applying a fixed control limit for the risk-adjusted Bernoulli chart causes to a variable in-control average run length performance for patient populations with dissimilar...
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Multivariate cumulative sum (MCUSUM) control charts are widely used in industry because they are powerful and easy to use. They cumulate recent process data to quickly detect out-of-control situations. MCUSUM procedures will usually give tighter process control than classical quality control charts. A MCUSUM signal does not mean that the process is producting bad product. Rather it means that a...
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In this paper, we propose a nonparametric CUSUM control chart for detecting a range of shifts in the location parameters based on previous research. This control chart is dynamically adaptive, ranks method-based nonparametric and self-starting; it can monitor various sizes of shifts in difference distributions simultaneously; and it can be used to monitor processes at the start-up stages. This ...
متن کاملA CUSUM Control Chart to Monitor Wafer Quality
C-control chart assumes that process nonconformities follow a Poisson distribution. In actuality, however, this Poisson distribution does not always occur. A process control for semiconductor based on a Poisson distribution always underestimates the true average amount of nonconformities and the process variance. Quality is described more accurately if a compound Poisson process is used for pro...
متن کاملA CUSUM Control Chart to Monitor Wafer Quality
C-control chart assumes that process nonconformities follow a Poisson distribution. In actuality, however, this Poisson distribution does not always occur. A process control for semiconductor based on a Poisson distribution always underestimates the true average amount of nonconformities and the process variance. Quality is described more accurately if a compound Poisson process is used for pro...
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ژورنال
عنوان ژورنال: Science and Technology Indonesia
سال: 2020
ISSN: 2580-4391,2580-4405
DOI: 10.26554/sti.2020.5.2.45-52